EEG Signal, Plant Disease Deep Learning, Smart Campus RFID, Blind Tech, Fraud Analytics Journal | IJCSE Volume 8 Issue 5 – Peer Reviewed
EEG Signal, Plant Disease Deep Learning, Smart Campus RFID, Blind Tech, Fraud Analytics – IJCSE Volume 8 Issue 5
International Journal of Computer Science Engineering Techniques (IJCSE). Cluster coverage: EEG data filtering, plant disease classification with deep learning, campus RFID security innovation, assistive blind tech, and ML credit card fraud detection.
Featured EEG, Plant DL, RFID, Fraud ML, Blind Tech Papers
EEG Adaptive Filtering—Rhythmic Component Extraction
Authors: Sabina Yasmin, MSU Zaman, Md. Ali Hossain
Download PaperPlant Disease Detection Using Deep Learning
Authors: Dr.Ravikumar, Dimpal Raj V, Sai Shreyas G H, Karthik S, Keerthana S
Download PaperSmart Eye Technology For Blind People Monitoring
Authors: Dr.T.Geetha, Mr.M.Karthi, Mr.M. Jijendra Prasath
Download PaperReal-Time Credit Card Fraud Detection Using ML
Authors: Dr.E.Punarselvam, G.Nivedhitha, B.Ilavarasan, R.Naveen Kishore, C.S. Pranav Adhithya, P. Prithivi Raj
Download PaperSmart Campus Using RFID
Authors: Meghana M, Nagarjun Gururaj Habbu, Santosh Kumar M T, Shreekala Tatachar K S, Varshitha R
Download PaperWhy Publish in EEG, Plant Deep Learning, RFID, Blind, Fraud Cluster Journals?
- Peer reviewed, open access for biometric signal extraction and deep learning cluster innovation
- Monthly publication in fraud ML, plant disease segmentation and campus RFID clusters
- Blind assistive cluster, campus security, machine learning fraud analytics
- Expert technical board, citation ranking, and open access innovation
