Deep Learning Libraries, Big Data Optimization, Plant Disease Deep Learning, Smart Campus RFID, Blind Tech, Fraud Analytics Journal | IJCSE Volume 8 Issue 6
Deep Learning, Big Data, Plant Disease, Campus RFID, Blind Tech, ML Fraud – IJCSE Volume 8 Issue 6
International Journal of Computer Science Engineering Techniques (IJCSE) (ISSN: 2455-135X). Cluster topics: deep learning framework comparison, big data cloud Hadoop, plant disease DL, campus RFID security, assistive blind tech, ML fraud analytics.
Featured DL, Big Data, Fraud ML, Plant Disease, Campus, Blind Tech Papers
A Comprehensive Comparison of Deep Learning Libraries [TensorFlow, PyTorch, FastAI, Keras, PyTorch Lightning]
Authors: Dr. Parashuram S. Vadar, Dr. Tejashree T. Moharekar, Dr. Urmila R. Pol
Download PaperSecurity, Optimization & Scalability Challenges in Big Data Ecosystems [Hadoop & Cloud]
Authors: Vedaprada Raghunath
Download PaperPlant Disease Detection Using Deep Learning
Authors: Dr.Ravikumar, Dimpal Raj V, Sai Shreyas G H, Karthik S, Keerthana S
Download PaperSmart Eye Technology For Blind Tech Monitoring
Authors: Dr.T.Geetha, Mr.M.Karthi, Mr.M. Jijendra Prasath
Download PaperReal-Time Credit Card Fraud Detection Using ML
Authors: Dr.E.Punarselvam, G.Nivedhitha, B.Ilavarasan, R.Naveen Kishore, C.S. Pranav Adhithya, P. Prithivi Raj
Download PaperSmart Campus Using RFID
Authors: Meghana M, Nagarjun Gururaj Habbu, Santosh Kumar M T, Shreekala Tatachar K S, Varshitha R
Download PaperWhy Publish in Deep Learning, Big Data, RFID, Blind, Fraud Cluster Journals?
- Peer reviewed, open access for DL library comparison and big data science
- Monthly publication for cloud, Hadoop, plant disease deep learning, campus RFID security
- Blind assistive solutions and real-time ML fraud analytics
- Expert technical board, citation ranking, open access innovation, ISSN and cluster keyword compliance
